Jarle André Johansen
Hui Xue,
Bjørn-Morten Batalden,
Puneet Sharma,
Jarle André Johansen,
Dilip K. Prasad
:
Biosignal-Based Driving Skill Classification Using Machine Learning: A Case Study of Maritime Navigation
Yngve Birkelund,
Jarle André Johansen,
Alfred Hanssen
:
High-precision surrogate data based tests for Gaussianity and linearity of discrete time random processes
European Signal Processing Conference 2015 DOI
Jarle André Johansen,
Bernt Inge Hansen
:
Experimental results on the pressure dependence of the minnaert resonance frequency for three different gases in water
Proceedings - IEEE Ultrasonics Symposium 2015 DOI
Bernt Inge Hansen,
Jarle André Johansen
:
Experimental results on the pressure dependence of the minnaert resonance frequency for nitrogen gas bubbles in water
Proceedings - IEEE Ultrasonics Symposium 2011 DOI
Jarle Andre Johansen,
Zhenrong Jin,
John D. Cressler,
Y Cui,
G Niu,
Q Liang
et al.:
On the scaling limits of low-frequency noise in SiGe HBTs
Solid-State Electronics 2004 DOI
Jarle Andre Johansen,
Zhenrong Jin,
John D. Cressler,
Y Cui,
G Niu,
Q Liang
et al.:
On the Scaling Limits of Low-Frequency Noise in SiGe HBTs
Solid-State Electronics 2004
Zhenrong Jin,
Jarle Andre Johansen,
John D. Cressler,
Robert A. Reed,
Paul W. Marshall,
Alvin J. Joseph
:
Using proton irradiation to probe the origins of low-frequency noise variations in SiGeHBTs
IEEE Transactions on Nuclear Science 2004
Xuyuan Chen,
Jarle Andre Johansen,
Cora Salm,
Arthur D. Van Rheenen
:
On low-frequency noise of polycrystalline GeSi for sub-micron CMOS technologies
Solid-State Electronics 2001
Xuyuan Chen,
Jarle Andre Johansen,
Arthur D. Van Rheenen,
Cora Salm
:
On the 1/f noise of polycrystalline GexSi1-x for sub-micron CMOS technologies”
Solid-State Electronics 2000
Jarle André Johansen,
Kåre Edvardsen,
Puneet Sharma,
Hassan Abbas Khawaja
:
Measuring the Sea Spray Flux using High-Speed Camera
2015 ARKIV
Bernt Inge Hansen,
Jarle André Johansen
:
Experimental results on the pressure dependence of the minnaert resonance frequency for nitrogen gas bubbles in water
2011
Jarle Andre Johansen,
Peng Qi
:
Model-Based Low-Frequency Noise Power Spectrum Density Fitting in SiGe HBTs
2007 OMTALE
Yngve Birkelund,
Alfred Hanssen,
Jarle Andre Johansen
:
High-precision surrogate based tests for gaussianity and linearity
2004
Yngve Birkelund,
Jarle Andre Johansen,
John D. Cressler,
Zhenrong Jin
:
A statistical tool for probing the coupling between noisytraps in semiconductor devices, with application to 1/f noise in SiGe HBTs
2004
Jarle Andre Johansen
:
Low-frequency Noise Characterization of Silicon-Germanium Resistors and Devices
UiT Norges arktiske universitet 2004
Yngve Birkelund,
Jarle Andre Johansen,
Alfred Hanssen
:
High-precision surrogate data based tests for Gaussianity and linearity of discrete time random processes
2004
Jarle Andre Johansen,
Yngve Birkelund,
Zhenrong Jin,
John D. Cressler
:
A Statistical Tool For Probing the Coupling Between Noisy Traps in Semiconductor Devices, With Application to 1/f Noise in SiGe HBTs
2004
Jarle Andre Johansen
:
Lavfrekevnt støy i Silisium-Germanium transistorer
2004
Yngve Birkelund,
Alfred Hanssen,
Jarle Andre Johansen,
Arthur D. van Rheenen,
John D. Cressler
:
Time series analysis of low-frequency noise in SiGe HBTs
2003
Jarle Andre Johansen,
Zhenrong Jin,
John D. Cressler,
Alvin J. Joseph
:
Geometry-Dependent Low-frequency Noise Variations in 120 GHz fT SiGe HBTs
2003
Zhenrong Jin,
Jarle Andre Johansen,
John D. Cressler,
Robert A. Reed,
Paul W. Marshall,
Alvin J. Joseph
:
Using Proton Irradiation to Probe the Origins of Low-frequency Noise Variations in SiGe HBTs
2003
Jarle Andre Johansen,
Zhenrong Jin,
John D. Cressler,
Yan Cui,
Guofu Niu,
Qingqing Liang
et al.:
On the Scaling Limits of Low-Frequency Noise in SiGe HBTs
2003
Chendong Zhu,
Qingqing Liang,
Ragad Al-Huq,
John D. Cressler,
Alvin J. Joseph,
Jarle Andre Johansen
et al.:
An Investigation of the Damage Mechanism in Impact Ionization-Induced "Mixed-Mode" Reliability Stressing of Scaled SiGe HBTs
2003
Yngve Birkelund,
Jarle Andre Johansen,
Alfred Hanssen,
John D. Cressler,
Arthur D. Van Rheenen
:
Time Series Analysis of Low-Frequency Noise in SiGe HBTs
2003
Xuyuan Chen,
Jarle Andre Johansen,
C. L. Liu
:
Temperature dependence of low-frequency electrical noise and reliability of semiconductor lasers
2001
Jarle Andre Johansen,
Hallvar Figenschau,
Xuyuan Chen,
Arthur D. Van Rheenen,
Cora Salm
:
Low Frequency Noise in Poly-Si- and Poly-SiGe-gated MOSFETs
2001
Xuyuan Chen,
Jarle Andre Johansen,
Arthur D. Van Rheenen,
Cora Salm
:
On the 1/f noise of polycrystalline GexSi1-x for sub-micron CMOS technologies
2000
Jarle Andre Johansen,
Xuyuan Chen,
Arthur D. Van Rheenen
:
Study of low-frequency noise in polycrystaline GexSi1-x
2000
Xuyuan Chen,
Jarle Andre Johansen,
Cora Salm,
Arthur D. Van Rheenen
:
On Low-Frequency Noise Of Polycrystalline GeSi For Sub-Micron CMOS Technologies
2000
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