Mathias Novik Jensen
Mathias Novik Jensen,
James C. Gates,
Alex I. Flint,
Olav Gaute Hellesø
:
Demonstrating low Raman background in UV-written SiO2 waveguides
Mathias Novik Jensen,
Olav Gaute Hellesø
:
Evaluation of crystalline structure quality of Czochralski-silicon using near-infrared tomography
Mathias Novik Jensen,
Olav Gaute Hellesø
:
Measuring the end-face of silicon boules using mid-infrared laser scanning
CrysteEngComm 09. Jun 2021 DOI
Mathias Novik Jensen,
Olav Gaute Hellesø
:
Measuring the end-face of silicon boules using mid-infrared laser scanning
CrysteEngComm 2021 DOI
Mathias Novik Jensen,
Olav Gaute Hellesø
:
Raman characterisation of UV-written silica waveguides
2022
Mathias Novik Jensen,
Benjamin Ricaud,
Olav Gaute Hellesø
:
De-noising and differentiation of low-SNR Raman-spectra of EV's
2022
Marek Vlk,
Md Rabiul Hasan,
Mathias Novik Jensen,
Olav Gaute Hellesø
:
Optical Metasurfaces and Waveguide Chips for Trapping and Raman Spectroscopy
2022
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